OEwaves Enables Quick and Effortless Ultra-Low Phase Noise Measurement for Microwave Sources

The National Institute of Standards and Technology (NIST) becomes an early adopter of OEwaves’ Ultra Low Phase Noise Measurement System.

(June 8, 2010) OEwaves’ OE8000 Ultra-low phase noise measurement system simplifies phase noise testing for NIST. The high performance measurement system requires virtually no setup, and its user friendly interface allows simple operation and quick phase noise measurements.

The unique measurement system was developed to measure OEwaves’ proprietary ultra-low phase noise opto-electronic oscillator (OEO) where its phase noise was not readily measurable by any other phase noise test system on the market without requiring an equally high performing reference source or down-converter. The cross-correlation capable homodyne phase noise measurement system is fast and fully automated, and yields the spectral density of the phase noise of a microwave oscillator at any operating frequency within the specified bands.

About OEwaves, Inc.
OEwaves, Inc. headquartered in Pasadena, Calif., is a leader in innovative microwave photonic products and solutions. OEwaves develops and offers state-of-the-art technologies and products in support of radar, communications, and test and measurement systems for military and commercial markets. OEwaves was founded in 2000 and has maintained an Intellectual Property Portfolio of 75 cases, 26 of which were licensed via and exclusive agreement with the California Institute of Technology (Caltech), to establish a secure path in which to develop our initial core technologies. For additional information, please visit www.oewaves.com.