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OE4100

HI-Q® OPTICAL RIN TEST AND MEASUREMENT SYSTEM

HI-Q® RF Test Measurement System (TMS) utilizes microwave photonics techniques for automated measurement of ultra-low phase noise oscillators.

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OEwaves’ HI-Q® RF Test Measurement System (TMS)

is fast and fully automated and yields the spectral density of the phase noise of an RF or microwave signal source at any operating frequency in the specified bands.

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This homodyne-based system is unique in wide frequency band measurement without requiring another low noise reference source or down-converter, as required in conventional heterodyne approaches. The system operates with ease, speed, and precision using a simple graphic user interface via a notebook PC.

HI-Q® OPTICAL RIN TEST AND MEASUREMENT SYSTEM

Specifications

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  • Ultra-Low Absolute Phase Noise/Jitter Measurement Capability

  • Fast Real-time Measurement

  • Fully Automated

  • Cross-Correlation Homodyne Capability

  • No Low Noise Reference Source Required

  • User Friendly Interface

  • Simple PC-based Operation

  • 6U x 19” Rack System

  • Customizable Configurations, Upgrades, and Options

Features

  • RMS Timing Jitter Sensitivity: 5 fs (100 Hz - 10 MHz)

  • Input Power Range: +5 to + 15 dBm

  • Spurious: -50 dBc @ <1 kHz offset / -80 dBc @ > 1kHz offset 

  • Resolution Bandwidth: 0.1 Hz - 200 kHz

Applications

  • Dual Channel Cross-Correlation Measurements

  • Extended Input and Offset Frequency Range Measurements

  • Two Port Residual Phase Noise Measurements

  • AM Noise Measurements

  • Extended Input Power Range

  • Optical Input

  • Performance Level and Frequency Range Options and Upgrades

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