Company’s Microwave Photonic Test and Measurement Division announces Excess
Laser Relative Intensity Noise (RIN) measurement option available for its HI-Q ® RIN
Analyzer product up to 40GHz.
PASADENA, Calif. – June 23, 2022 – OEwaves, Inc., a leader in innovative
microwave photonic products and solutions, today launched a new optional Excess
Laser Relative Intensity Noise (RIN) measurement feature for its acclaimed high
frequency OE4001 RIN Analyzer system. The new Excess RIN measurement feature
removes the inherent shot noise and thermal/system noise common in conventional
laser RIN measurement method in the standard OE4001 RIN Analyzer. The new
feature boasts Excess RIN floor extending down to -168 dB/Hz or better.
Total noise from a laser typically includes shot noise, thermal/system noise, and
light power (total photon energy per second) fluctuation. RIN is defined to
represent the total amount of photon noise within a given bandwidth. However, the
term RIN and excess photon noise have often been used interchangeably and have
been set equal for most applications. Nevertheless, it is critical to differentiate the
excess photon noise from other sources of noise in applications such as coherent
communication, optical sensors, clinical research, as well as other emerging fields
where excess photon noise is limiting the performance.
OEwaves HI-Q ® OE4001 RIN Analyzer is a high frequency ultra-low RIN
measurement system developed to support a wide range of wavelengths covering
spectral bands from visible to near-infrared wavelength. With the new optional
Excess RIN feature the system provides a complete total and excess laser RIN
measurement capability up to 40 GHz. OE4001 RIN Analyzer operates with ease,
speed, and precision, via a simple graphic user interface on a notebook PC, without
requiring any additional test equipment.
The OEwaves HI-Q ® ultra-low noise measurement product family consists of our
flagship OE4000 Laser Phase Noise/Linewidth Analyzer, OE4001 RIN Analyzer, and
OE8000 Microwave Phase Noise Analyzer systems and are available in a variety of
configurations and options, among other customizable configurations.
Additional Information
More information about OEwaves’ leading microwave photonic products is available
at www.oewaves.com
About OEwaves, Inc.
OEwaves, Inc., headquartered in Pasadena, California, develops state-of-the-art
technologies and provides products in support of communication, sensor,
RADAR/LIDAR, stable clocking, and test and measurement systems for commercial
and military markets. OEwaves was founded in 2000 and has maintained an
Intellectual Property Portfolio of over 126 cases and has received numerous awards,
including two prestigious SPIE Prism Awards, as well as the Patrick Soon-Shiong
Innovation Award. The company has been ranked in the top 20 of the Institute of
Electrical and Electronics Engineers (IEEE) Semiconductor Manufacturing Patent
Power. OEwaves, Inc. is ISO9001/AS9100D certified.