Search

OEwaves Introduces Excess Laser RIN Measurement Feature

Updated: Oct 4

Company’s Microwave Photonic Test and Measurement Division announces Excess

Laser Relative Intensity Noise (RIN) measurement option available for its HI-Q ® RIN

Analyzer product up to 40GHz.



OEwaves Introduces Excess Laser RIN Measurement Feature


PASADENA, Calif. – June 23, 2022 – OEwaves, Inc., a leader in innovative

microwave photonic products and solutions, today launched a new optional Excess

Laser Relative Intensity Noise (RIN) measurement feature for its acclaimed high

frequency OE4001 RIN Analyzer system. The new Excess RIN measurement feature

removes the inherent shot noise and thermal/system noise common in conventional

laser RIN measurement method in the standard OE4001 RIN Analyzer. The new

feature boasts Excess RIN floor extending down to -168 dB/Hz or better.


Total noise from a laser typically includes shot noise, thermal/system noise, and

light power (total photon energy per second) fluctuation. RIN is defined to

represent the total amount of photon noise within a given bandwidth. However, the

term RIN and excess photon noise have often been used interchangeably and have

been set equal for most applications. Nevertheless, it is critical to differentiate the

excess photon noise from other sources of noise in applications such as coherent

communication, optical sensors, clinical research, as well as other emerging fields

where excess photon noise is limiting the performance.


OEwaves HI-Q ® OE4001 RIN Analyzer is a high frequency ultra-low RIN

measurement system developed to support a wide range of wavelengths covering

spectral bands from visible to near-infrared wavelength. With the new optional

Excess RIN feature the system provides a complete total and excess laser RIN

measurement capability up to 40 GHz. OE4001 RIN Analyzer operates with ease,

speed, and precision, via a simple graphic user interface on a notebook PC, without

requiring any additional test equipment.


The OEwaves HI-Q ® ultra-low noise measurement product family consists of our

flagship OE4000 Laser Phase Noise/Linewidth Analyzer, OE4001 RIN Analyzer, and

OE8000 Microwave Phase Noise Analyzer systems and are available in a variety of

configurations and options, among other customizable configurations.


Additional Information


More information about OEwaves’ leading microwave photonic products is available

at www.oewaves.com


About OEwaves, Inc.


OEwaves, Inc., headquartered in Pasadena, California, develops state-of-the-art

technologies and provides products in support of communication, sensor,

RADAR/LIDAR, stable clocking, and test and measurement systems for commercial

and military markets. OEwaves was founded in 2000 and has maintained an

Intellectual Property Portfolio of over 126 cases and has received numerous awards,

including two prestigious SPIE Prism Awards, as well as the Patrick Soon-Shiong

Innovation Award. The company has been ranked in the top 20 of the Institute of

Electrical and Electronics Engineers (IEEE) Semiconductor Manufacturing Patent

Power. OEwaves, Inc. is ISO9001/AS9100D certified.