OE4001

Hi-Q Laser RIN Analyzer

The OEwaves’ HI-Q® OE4001 Optical Test Measurement System (TMS) offers a fully automated measurement of ultra-low RIN (Relative Intensity Noise) CW laser sources.

HI-Q® RIN Analyzer is capable of automatically and rapidly measuring relative intensity noise spectrum without complex setup.

This system is unique in wideband measurement. The complete system operates with ease, speed and precision via a simple graphic user interface on a dedicated PC. No additional test equipment required. The unmatched ultra-low relative intensity noise analyzer is scalable to various input wavelength bands and is available with multiple frequency range options. This system is ideal for manufacturing and research environments.

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Features

  • Ultra-Low Relative Intensity Noise Measurement

  • Fast Real-time Measurement

  • User Friendly Interface

  • Simple PC-based Operation

  • 3U x 19” Rack System

Specifications

  • Ultra-low total RIN Floor -161 dBc/Hz and -166 dBc/Hz for Excess RIN option

  • Optical Input Power Range +5 to +15 dBm (SM-FC/APC)

  • Offset Frequency Range 100MHz – 18GHz, 27GHz or 40GHz 1Hz – 100MHz available in OE4000

  • Measurement Type Relative Intensity Noise

  • Data Storage and I/O HDD/USB Port

  • Operating Temperature Range 15°C to 35°C

  • Power 110/120 or 220/240 Vac; 50/60Hz

  • Size 3U x 19: Rack Mount Larger for 40GHz option

Optional Configurations

  • Excess laser RIN measurement option where shot and thermal noises are removed

  • Multiple Input Wavelength Bands
    within 740 nm – 2150 nm

  • Ultra-Low Noise Floor

  • Extended Frequency Range up to
    40 GHz

  • Extended Input Power Range

  • Remote Operation

  • Range Options and Upgrades

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