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OEwaves Introduces Laser Linewidth Narrowing Option for the OE4000

Company’s Microwave Photonic Test and Measurement Division announces laser linewidth/phase noise reduction feature available for its...

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OEwaves Announces Optical Frequency Monitoring Feature for Laser Testing

Company’s Microwave Photonic Test and Measurement Division introduces laser frequency monitoring option available for its HI-Q® Laser...

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OEwaves Introduces its Next Generation of Lasers - the OE4040 Series

OEwaves is excited to introduce our 4th Generation Hi-Q Laser. The OE4040. This new generation of Ultra-low Noise C-Band Lasers has...

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The Gold Standard! Next Generation High-Performance Lasers

Advances made by Lute Maleki, former researcher at NASA’s Jet Propulsion Laboratory in Pasadena, CA, and his JPL colleagues for space...

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Time Crystals: Improving Oscillators and Clocks

A paper published in the July/August 2022 Optics and Photonic News focuses on the latest developments in Time Crystals and highlights the...

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OEwaves Introduces Excess Laser RIN Measurement Feature

Company’s Microwave Photonic Test and Measurement Division announces Excess Laser Relative Intensity Noise (RIN) measurement option...

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Novel Wavelengths (370 nm - 4500 nm)