OE4001

Hi-Q® Laser RIN Analyzer

The OEwaves’ HI-Q® OE4001 Optical Test Measurement System (TMS) offers a fully automated measurement of ultra-low RIN (Relative Intensity Noise) CW laser sources.

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Features and Specifications

Features

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  • Ultra-low relative intensity noise measurement
  • Fast real-time measurement
  • User-friendly interface
  • Simple PC-based operation
  • 3U x 19” Rack System

Specifications

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  • Ultra-low total RIN floor:  -161 dBc/Hz and -166 dBc/Hz for excess RIN option
  • Optical input power range:  +5 to +15 dBm (SM-FC/APC)
  • Offset frequency range:  100 MHz – 18 GHz, 27 GHz, 40 GHz, 54 GHz, or 67 GHz. (1 Hz – 100 MHz available in OE4000)
  • Measurement type: Relative intensity noise
  • Operating temperature range: 15 °C to 35 °C
  • Power: 110/120 or 220/240 Vac; 50/60 Hz
  • Size: 3U x 19
  • Rack mount larger for 40 GHz option
  • Data storage and I/O HDD/USB port

Optional Configurations

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  • Excess laser RIN measurement option where shot and thermal noises are removed
  • Multiple input wavelength bands within 740 nm – 2150 nm
  • Ultra-low noise floor
  • Extended frequency range up to 67 GHz
  • Extended input power range
  • Remote operation
  • Range options and upgrades

Product Intro

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