Ultra-Precise

Hi-Q Optical Test & Measurement Systems

OEwaves’ HI-Q® Optical Test Measurement System delivers fast, precise phase noise and linewidth measurements—no reference sources needed. With a low-noise floor and intuitive interface, it combines simplicity, speed, and high performance in one turnkey solution.

OE4001

Hi-Q® Laser RIN Analyzer

The OEwaves’ HI-Q® OE4001 Optical Test Measurement System (TMS) offers a fully automated measurement of ultra-low RIN (Relative Intensity Noise) CW laser sources.

OE4000

Hi-Q® Multifunctional Laser Noise Analyzer

Using a homodyne methodology, HI-Q® Laser Linewidth / Phase Noise Analyzer offers a fully automated measurement of ultra-low phase noise CW laser sources.

Features and Specifications

Features

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  • Ultra-low phase/frequency noise measurement
  • Fast real-time measurement
  • Intrinsic and effective FWHM linewidth analysis
  • No low noise reference source required
  • User-friendly interface
  • Remote operation
  • 3U x 19" Rack system
  • USB or RS-232 control interface

Applications

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  • Interferometric optical sensing
  • LIDAR
  • B-OTDR temperature and strain
  • Gas sensing
  • Optical metrology and spectroscopy
  • Acoustic sensing
  • Oil and gas exploration
  • Coherent communication
  • Test and measurement

Hi-Q® Laser RIN Analyzer

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  • Measurement type: Laser Relative Intensity Noise
  • Noise floor: -161 dBc/Hz and -166 dBc/Hz for XRIN option
  • Wavelength: Multiple bands between 400 nm and 2200 nm
  • Resolution bandwidth: 100 MHz to 40 GHz, depending on configuration

Hi-Q® Multifunctional Laser Noise Analyzer

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  • Measurement type: Laser Linewidth / Phase Noise / Laser RIN / Laser Frequency Stability / Laser Linewidth
  • Noise floor: -160 dBc/Hz @ >1 MHz
  • Wavelength: Multiple bands between 400 nm and 2200 nm
  • Resolution bandwidth: 0.1 Hz to 200 kHz

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