• Ultra-low absolute phase noise/jitter measurement capability
• Fast, real-time measurement
• Fully automated
• Cross-correlation homodyne capability
• No low noise reference source required
• User-friendly interface
• Simple PC-based operation
• 6U x 19” Rack system

• RMS timing jitter sensitivity: 5 fs (100 Hz - 10 MHz)
• Input power range: +5 to + 15 dBm
• Spurious: -50 dBc @ <1 kHz offset / -80 dBc @ > 1kHz offset
• Resolution bandwidth: 0.1 Hz - 200 kHz

• Dual channel cross-correlation measurements
• Extended input and offset frequency range measurements
• Two port residual phase noise measurements
• AM noise measurements
• Extended input power range
• Optical input
• Performance level and frequency range options and upgrades

OEwaves’ HI-Q® RF Test Measurement System (TMS) is a fast, fully automated solution for measuring the phase noise spectral density of RF and microwave signal sources across a wide range of frequencies.​ Unlike conventional heterodyne systems, this homodyne-based approach eliminates the need for a separate low-noise reference source or down-converter. The system delivers accurate, wideband measurements with ease, operated through an intuitive graphical user interface on a notebook PC.

OEwaves' HI-Q® W-Band Phase Noise Analyzer utilizes microwave photonics techniques for automated measurement of ultra-low phase noise W-band oscillators. Check it out here.