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HI-Q® OPTICAL TEST & MEASUREMENT SYSTEMS

OEwaves’ HI-Q® Optical Test Measurement Systems (OTMS) offers simple, automated measurement of phase noise (RF) and linewidth/frequency noise (optical) without requiring other reference sources. The complete system operates with ease, performance (low-noise floor), speed, precision, and a simple graphical user interface.

Features

  • Ultra-Low Phase/Frequency Noise Measurement

  • Fast Real-Time Measurement

  • Intrinsic and Effective FWHM Linewidth Analysis

  • No Low Noise Reference Source Required

  • User Friendly Interface

  • Remote Operation 

  • 3U x 19" Rack System

  • Customizable Configuration, Future Upgrades, and Options

Applications

  • Interferometric Optical Sensing

  • LIDAR

  • B-OTDR Temperature and Strain

  • Gas Sensing

  • Optical Metrology and Spectroscopy

  • Acoustic Sensing

  • Oil and Gas Exploration

  • Coherent Communication

  • Test and measurement

Product
Measurement Type
Noise Floor
Wavelength
Resolution Bandwidth

OE4001 Hi-Q Laser RIN Analyzer

Laser Relative Intensity Noise
-161 dBc/Hz and -166 dBc/Hz for XRIN option
Multiple bands between 400 nm and 2200 nm
100 MHz to 40 GHz, depending on configuration

OE4000 HI-Q® Multifunctional Laser Noise Analyzer

Laser Linewidth / Phase Noise / Laser RIN / Laser Frequency Stability / Laser Linewidth
-160 dBc/Hz @ >1 MHz
Multiple bands between 400 nm and 2200 nm
0.1 Hz to 200 kHz
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