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HI-Q® TEST MEASUREMENT SYSTEMS

OEwaves’ HI-Q® Test Measurement Systems (TMS) offers simple, automated measurement of phase noise (RF) and linewidth/frequency noise (optical) without requiring other reference sources. The complete system operates with ease, performance (low-noise floor), speed, precision, and a simple graphical user interface. The Test Measurement Systems come with RF or Optical measurement capabilities.

Features

  • Interferometric Optical Sensing

  • LIDAR

  • B-OTDR Temperature and Strain

  • Gas Sensing

  • Optical Metrology and Spectroscopy

  • Acoustic Sensing

  • Oil and Gas Exploration

  • Coherent Communication

  • Test and measurement

Applications

  • Interferometric Optical Sensing

  • LIDAR

  • B-OTDR Temperature and Strain

  • Gas Sensing

  • Optical Metrology and Spectroscopy

  • Acoustic Sensing

  • Oil and Gas Exploration

  • Coherent Communication

  • Test and measurement

Products
Wavelength
Spectral Linewidth
Output Power
Thermal Tuning Range

HI-Q® 1.5 MICRON LASER - Hertz Linewidth

1530 -1565nm
10mW
<7Hz
10GHz (mode hop free)

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HI-Q® NEAR IR LASER

770 - 790nm
up to 100mW
< 80Hz
10GHz (mode hop free)

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HI-Q® 1 MICRON LASER

980 - 1080nm
5 - 10mW
< 80Hz
10GHz (mode hop free)

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HI-Q® 1.5 MICRON LASER - tunable

1530 - 1565nm
18mW
20Hz
30GHz (mode hop free / continuous)

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HI-Q® 1.5 MICRON LASER - sub-hertz

1530 – 1565nm
10mW
< 3Hz (< 1Hz upon request)
10GHz (mode hop free)

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HI-Q® 2 MICRON LASER

1900 – 2100nm
1-2mW
< 80Hz
10GHz (mode hop free)

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HI-Q® NOVEL WAVELENGTHS LASER

370 - 4500nm
1 to 100 mW
Sub-Hz to 100 Hz
≤ 10 GHz (mode hop free)

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