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HI-Q® TEST MEASUREMENT SYSTEMS
OEwaves’ HI-Q® Test Measurement Systems (TMS) offers simple, automated measurement of phase noise (RF) and linewidth/frequency noise (optical) without requiring other reference sources. The complete system operates with ease, performance (low-noise floor), speed, precision, and a simple graphical user interface. The Test Measurement Systems come with RF or Optical measurement capabilities.
Features
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Interferometric Optical Sensing
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LIDAR
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B-OTDR Temperature and Strain
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Gas Sensing
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Optical Metrology and Spectroscopy
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Acoustic Sensing
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Oil and Gas Exploration
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Coherent Communication
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Test and measurement
Applications
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Interferometric Optical Sensing
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LIDAR
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B-OTDR Temperature and Strain
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Gas Sensing
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Optical Metrology and Spectroscopy
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Acoustic Sensing
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Oil and Gas Exploration
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Coherent Communication
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Test and measurement
Products | Wavelength | Spectral Linewidth | Output Power | Thermal Tuning Range | |
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HI-Q® 1.5 MICRON LASER - Hertz Linewidth | 1530 -1565nm | 10mW | <7Hz | 10GHz (mode hop free) | |
HI-Q® NEAR IR LASER | 770 - 790nm | up to 100mW | < 80Hz | 10GHz (mode hop free) | |
HI-Q® 1 MICRON LASER | 980 - 1080nm | 5 - 10mW | < 80Hz | 10GHz (mode hop free) | |
HI-Q® 1.5 MICRON LASER - tunable | 1530 - 1565nm | 18mW | 20Hz | 30GHz (mode hop free / continuous) | |
HI-Q® 1.5 MICRON LASER - sub-hertz | 1530 – 1565nm | 10mW | < 3Hz (< 1Hz upon request) | 10GHz (mode hop free) | |
HI-Q® 2 MICRON LASER | 1900 – 2100nm | 1-2mW | < 80Hz | 10GHz (mode hop free) | |
HI-Q® NOVEL WAVELENGTHS LASER | 370 - 4500nm | 1 to 100 mW | Sub-Hz to 100 Hz | ≤ 10 GHz (mode hop free) |