Ultra-Narrow Linewidth Lasers >
Novel Wavelengths (370 nm - 4500 nm)
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Measuring Phase Noise
The OE4000 HI-Q® Laser Linewidth/Phase Noise Analyzer features advanced capabilities for single frequency laser source characterization all in one system.
How to measure laser linewidth and also detect laser instability and jitter behavior?
OEwaves OE4000 Laser Linewidth/Phase Noise Analyzer is capable of measuring ultra-narrow linewidth and observe optical frequency jitter and stability over time with the optional laser frequency monitoring feature.
Can linewidth/phase noise analyzer monitor laser frequency drift?
OEwaves OE4000 with the optical frequency monitoring option enables the user to determine the laser under test’s frequency drift in the time domain.
How to verify interference signal effects on the laser source?
The optical frequency monitoring feature available as an option in the OEwaves OE4000 Laser Linewidth and Phase Noise Analyzer may exhibit laser under test frequency disturbances and deviation over a period of time.