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OEwaves Announces Optical Frequency Monitoring Feature for Laser Testing

Updated: Oct 4, 2022

Company’s Microwave Photonic Test and Measurement Division introduces laser frequency monitoring option available for its HI-Q® Laser Linewidth/Phase Noise Analyzer product.

PASADENA, Calif. – September 22, 2022 – OEwaves, Inc., a leader in innovative microwave photonic products and solutions, today launched a new time domain laser frequency monitoring feature for its flagship ultra-sensitive OE4000 Laser Linewidth and Phase Noise Analyzer product family. This new feature precisely measures the optical frequency drift and deviation of the laser under test (LUT) with high refresh rate over a user specified period of time, allowing the end user to further characterize the LUT and gain valuable insight into its behavior in the time domain.

The optical frequency monitoring option allows the users to analyze the LUT’s frequency drift over longer periods of time, in addition to OE4000’s unmatched ultra-low frequency/phase noise and linewidth measurement within relatively shorter time scales. This feature will be of particular interest for laser sources in wavelength regions from visible spectrum to over 2 microns. Monitoring the LUT in real time is critical to ensure its frequency stability and to characterize any jitter and/or interference behavior, as well as determining its drift rate and range within the user specified time period.

The OEwaves HI-Q®OE4000 Laser Linewidth/Phase Noise Analyzer is a highly sensitive homodyne based ultra-low frequency noise narrow linewidth measurement system developed to support a wide range of laser wavelengths covering spectral bands from visible to near-infrared (NIR) wavelengths. With the new optional optical frequency monitoring feature, the OE4000 system provides additional measurement capability in the time domain. The OE4000 Laser Linewidth/Phase Noise Analyzer operates with ease, speed, and precision, via a simple graphic user interface on a notebook PC, without requiring any additional test equipment.

OEwaves Announces Optical Frequency Monitoring Feature for Laser Testing

The OEwaves HI-Q® ultra-low noise measurement product family consists of the OE4000 Laser Phase Noise/Linewidth Analyzer, OE4001 RIN Analyzer, and OE8000/W Microwave/W-Band Phase Noise Analyzer systems and are available in a variety of configurations and options.

More information about OEwaves’ leading microwave photonic products is available at

About OEwaves, Inc. OEwaves, Inc., headquartered in Pasadena, California, sells unmatched low-noise, narrow-linewidth lasers, opto-electronic oscillators, and phase noise measurement systems for advanced communication, sensing and quantum systems and beyond. OEwaves has been ranked in the top 20 of the Institute of Electrical and Electronics Engineers (IEEE) Semiconductor Manufacturing Patent Power and is ISO9001/AS9100D certified.

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