OE8000
HI-Q® RF TEST AND MEASUREMENT SYSTEM
OEwaves’ HI-Q® RF Test Measurement System (TMS) is a fast, fully automated solution for measuring the phase noise spectral density of RF and microwave signal sources across a wide range of frequencies.
Unlike conventional heterodyne systems, this homodyne-based approach eliminates the need for a separate low-noise reference source or down-converter. The system delivers accurate, wideband measurements with ease, operated through an intuitive graphical user interface on a notebook PC.
Features
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Ultra-Low Absolute Phase Noise/Jitter Measurement Capability
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Fast Real-time Measurement
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Fully Automated
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Cross-Correlation Homodyne Capability
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No Low Noise Reference Source Required
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User Friendly Interface
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Simple PC-based Operation
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6U x 19” Rack System
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Customizable Configurations, Upgrades, and Options
Specifications
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RMS Timing Jitter Sensitivity: 5 fs (100 Hz - 10 MHz)
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Input Power Range: +5 to + 15 dBm
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Spurious: -50 dBc @ <1 kHz offset / -80 dBc @ > 1kHz offset
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Resolution Bandwidth: 0.1 Hz - 200 kHz
Optional Configurations
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Dual Channel Cross-Correlation Measurements
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Extended Input and Offset Frequency Range Measurements
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Two Port Residual Phase Noise Measurements
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AM Noise Measurements
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Extended Input Power Range
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Optical Input
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Performance Level and Frequency Range Options and Upgrades