Search

Webinar: HI-Q® Optical Phase Noise Test System, Presented at OIDA Technology Showcase

On Tuesday, December 1, 2020, OEwaves was one of the presenting companies at the OSA (The Optical Society) Industry Development Associates Technology Showcase. The event is OSA's second virtual technology showcase event since the start of Covid-19 quarantines. OEwaves was represented by Dr. Danny Eliyahu, Director of Quality Assurance and Metrology​ at OEwaves, and focused specifically on the OE4000 HI-Q® Optical Phase Noise Test System.


In case you missed it, we recorded the session to view below. Please subscribe to our newsletter (scroll down to sign up in the footer) to be notified of future events. What other products or applications would you like to see us cover in upcoming webinars? Please share your thoughts in the comments.



ABOUT THE EVENT


OE4000 Optical Phase Noise/Linewidth/RIN Analyzer

The HI-Q® OE4000 is a homodyne optical discriminator with a modular design characterized by very low noise floor. This analyzer measures spectral density of the phase/frequency noise of optical sources, laser linewidth and offers the option for RIN (intensity noise) measurement. The proprietary measurement technique employed in the OE4000 does not require a second low noise source for reference and the analyzer system is fully automated. The OE4000 has many different configuration options of wavelength bands, noise floors and various options. Multiple bands and combined bands can be chosen, there are RIN measurement options that extend out to 40GHz and all configurations are upgrade-compatible. Topics focus on:

  • OE4000 Homodyne Phase Noise/Linewidth/RIN Analyzer System

  • Benefits of measuring spectral density of phase/frequency noise vs. basic linewidth measurement

  • OE4000 GUI and user-friendly features and benefits

  • OE4000 configuration options

SPEAKER BIO

Danny Eliyahu, Director of Quality Assurance and Metrology​, OEwaves

Dr. Danny Eliyahu joined OEwaves 19 years ago. He currently serves as the Director of Quality Assurance and Metrology at OEwaves. He has over 25 years of experiences in mode-locked lasers, opto-electronic oscillators, and lasers and oscillators noise. His research and development interests include low phase noise high performance lasers and oscillators, microwave and photonics test measurement system, and high frequency receivers. Dr. Eliyahu is the author and co-author of over 50 papers and patents.