OE4000
HI-Q® LASER LINEWIDTH/PHASE NOISE ANALYZER
Using a homodyne methodology, HI-Q® Laser Linewidth / Phase Noise Analyzer offers a fully automated measurement of ultra-low phase noise CW laser sources.
HI-Q® Laser Linewidth / Phase Noise Analyzer is capable of rapidly measuring laser phase noise and estimating its FWHM linewidth down to < 3 Hz without complex setup or reference lasers normally required to make such a narrow linewidth measurement.
This homodyne-based system is unique in wideband measurement without requiring another low noise reference laser source. The complete system operates with ease, speed and precision via a simple graphic user interface on an embedded PC accessible via user supplied eternal PC or monitor/keyboard/mouse. No additional test equipment required. The unmatched ultra-low phase/frequency noise analyzer is scalable to various input wavelength bands and is available with low relative intensity noise (RIN) measurement option.
Features
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Ultra-Low Phase/Frequency Noise Measurement Capability
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Fast Real-Time Measurement
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Instantaneous and Extended FWHM Linewidth Analysis
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No Low Noise Reference Source Required
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User Friendly Interface
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Simple PC-based Operation
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3U x 19” Rack System
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Customizable Configurations, Upgrades, and Options
Factory PC option shown
The table below shows a range of possible performance values at a variety of wavelength bands for the OE4000 Phase Noise Analyzer. Depending on the configuration, a single device will not be able to meet all displayed performance specs at the same time.
Title | Instantaneous Linewidth [Hz] | Extended Linewidth | Phase Noise Floor [dBc/Hz] | RIN Floor [dB/Hz] |
|---|---|---|---|---|
454 – 464 nm* (at +15 dBm) | 50 | 4.6 kHz - 100 MHz | -140 | -146 |
505 – 515 nm | 35 | 2.5 kHz - 100 MHz | -142 | -146 |
575 – 710 nm | 20 | 1 kHz - 100 MHz | -148 | -147 |
600 – 710 nm | 18 | 950 Hz - 100 MHz | -149 | -148 |
740 – 935 nm | 10 | 800 Hz - 60 MHz | -153 | -152 |
930 – 965 nm | 5 | 600 Hz - 45 MHz | -153 | -152 |
965 – 1070 nm | 3 | 500 Hz - 30 MHz | -154 | -153 |
1000 – 1100 nm | 2 | 400 Hz - 30 MHz | -155 | -153 |
1170 – 1260 nm | 2 | 350 Hz - 30 MHz | -156 | -154 |
1530 - 1565 nm (C-Band) | 0.5 | 3 Hz - 10 MHz | -160 | -158 |
1260 - 1360 nm (O-Band) | 1 | 300 Hz - 30 MHz | -157 | 155 |
1360 - 1460 nm (E-Band) | 1 | 200 Hz - 30 MHz | -158 | 156 |
1460 - 1530 nm (S-Band) | 2 | 400 Hz - 30 MHz | -154 | 153 |
1565 - 1625 nm (L-Band) | 1 | 300 Hz - 30 MHz | -157 | 155 |
420 – 510 nm | 50 | 3 kHz - 100 MHz | -140 | -141 |
Specifications
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Phase Noise Floor: -140 ± 2 dBc/Hz @ >1 MHz
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Optical Input Power Range: up to + 15 dBm
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Offset Frequency Range: 10 Hz - 1 MHz
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Resolution Bandwidth: 0.1 Hz - 200 kHz
Optional Configurations
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Multiple Input Wavelength Bands between 420 nm - and 2.2 µm
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Ultra-low Noise Floor
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RIN Measurements
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Extended offset Frequency Range up to 2 GHz
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Extended Input Power Range
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Remote Operation
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Performance Level and Frequency
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Range Options and Upgrades