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OE4000
HI-Q® LASER LINEWIDTH/PHASE NOISE ANALYZER
Using a homodyne methodology, HI-Q® Laser Linewidth / Phase Noise Analyzer offers a fully automated measurement of ultra-low phase noise CW laser sources.
HI-Q® Laser Linewidth / Phase Noise Analyzer is capable of rapidly measuring laser phase noise and estimating its FWHM linewidth down to < 3 Hz without complex setup or reference lasers normally required to make such a narrow linewidth measurement.
This homodyne-based system is unique in wideband measurement without requiring another low noise reference laser source. The complete system operates with ease, speed and precision via a simple graphic user interface on an embedded PC accessible via user supplied eternal PC or monitor/keyboard/mouse. No additional test equipment required. The unmatched ultra-low phase/frequency noise analyzer is scalable to various input wavelength bands and is available with low relative intensity noise (RIN) measurement option.

Features
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Ultra-Low Phase/Frequency Noise Measurement Capability
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Fast Real-Time Measurement
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Instantaneous and Extended FWHM Linewidth Analysis
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No Low Noise Reference Source Required
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User Friendly Interface
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Simple PC-based Operation
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3U x 19” Rack System
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Customizable Configurations, Upgrades, and Options
Factory PC option shown
Specifications
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Phase Noise Floor: -140 ± 2 dBc/Hz @ >1 MHz
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Optical Input Power Range: +5 to + 15 dBm
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Offset Frequency Range: 10 Hz - 1 MHz
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Resolution Bandwidth: 0.1 Hz - 200 kHz
Optional Configurations
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Multiple Input Wavelength Bands within 630 nm-2.2 µm
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Ultra-low Noise Floor
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RIN Measurements
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Extended offset Frequency Range up to 2 GHz
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Extended Input Power Range
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Remote Operation
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Performance Level and Frequency
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Range Options and Upgrades