HI-Q Optical Test Measurement System
OEwaves’ HI-Q Optical Test Measurement System utilizes a homodyne methodology for automated measurement capable of testing ultra-low phase noise laser sources. The user friendly test system is capable of rapidly measuring <10 Hz of Lorentzian linewidth of a laser source without the complicated setup typically required to make such a narrow linewidth measurement.
This homodyne based system is unique in wide band measurement without requiring another low noise reference laser source. The complete system operates with ease, speed and precision, and a simple graphic user interface via a PC, without requiring any additional test equipment. The unmatched ultra-low phase/frequency noise analyzer system is scalable to various input wavelengths and capable of low relative intensity noise (RIN) measurement.
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